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2 edition of 1973 IEEE Intercon technical papers found in the catalog.

1973 IEEE Intercon technical papers

Institute of Electrical and Electronics Engineers. International Convention and Exposition

1973 IEEE Intercon technical papers

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Published by I.E.E.E. in New York .
Written in English


Edition Notes

Statementpresented at the Institute of Electrical and Electronics Engineers International Convention and Exposition, March 26-30, 1973.
ID Numbers
Open LibraryOL14419908M

Full text of "Quarterly technical progress report of the Information Engineering Laboratory" See other formats. IEEE Transactions on Power Systems, Vol. 14, NO.3, August The IEEE Reliability Test System = Application of Probability Methods Subcommittee A report prepared by the Reliability Test System Task Force of the ABslRAcT This oeportdescribesan enhanced testsystem (WW)for MW In bulk power system reliability evaluation value ofFile Size: KB.


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1973 IEEE Intercon technical papers by Institute of Electrical and Electronics Engineers. International Convention and Exposition Download PDF EPUB FB2

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